Keysight E5061B Vector Network Analyzer
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Application
- The Keysight E5061B Vector Network Analyzer tests electronic devices up to 3 GHz. With its excellent stability and 5 Hz to 3 GHz option, it is useful for both manufacturing and R&D.
Key Features
- Option 006 wireless power transfer analysis software
- Measurements in real-time
- Arbitrary load impedance defined by users
- Coupling efficiency measurements available
- Advanced 2D/3D simulation
| IF Bandwidth Range | 1 Hz to 300 kHz Nominal settings are: 1, 1.5, 2, 3, 4, 5, 7 |
|---|---|
| Number of points per trace | 2 to 1,601 |
| Connectors | Type-N, female; 50 Ω or 75 Ω (Ports 1 and 2) BNC, female; 50 Ω or 1 M Ω (Ports R and T) BNC, female; 50 Ω (LF Out) |
| Probe power (Option 3L3/3L4/3L5) |
15 V ± 5 % (400 mA) -12.6 V ± 5 % (300 mA) (combined load for both probe connections) |
| Display | Size: 10.4 inch multi touchscreen LCD Resolution: XGA (1024 x 768) |
| Line power | Frequency: 47 Hz to 63 Hz Voltage: 90 - 264 VAC (Vpeak > 120V) VA max: 300 VA max |
| Power consumption | 120 W (SPD) 135 W (SPD) with Option 3L5 |
| Operating temperature | +5 ° C to +40 ° C |
| Humidity | 20 % to 80 % at wet bulb temperature $lt; +29 ° C (non-condensing) |
| Altitude | 0 to 2,000 m (0 to 6,561 feet) |
| Vibration | 0.21 G maximum, 5 Hz to 500 Hz |
| Weight | 13.1 kg (Option 1xx/2xx) 14.4 kg (Option 3L3/3L4/3L5) |
| Dimensions | (W 380 x H 222 x D 297) mm |
| Internal hard disk drive | Store and recall instrument states, calibration data, and trace data into internal hard drive. Trace data can be saved in CSV (comma separated value) format. All files are MS-DOS compatible. Instrument states include all control settings, limit lines, segment sweep tables, and memory trace data. |
| File sharing | Internal hard disk drive (D:) can be accessed from an external Windows PC through LAN. |
| Screen hardcopy | Printouts of instrument data are directly produced on a printer through USB interfaces. |
| Limit lines | Define the test limit lines that appear on the display for pass/fail testing. Defined limits may be any combination of horizontal/sloping lines and discrete data points. |
| For detailed specifications please see: Keysight E5061B Data Sheet | |